AFM-SPM Analyzer Purpose The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements. Capabilities - Topography imaging and analysis - Surface roughness calculation (Ra, RMS) - Force-distance curve analysis - Nanoindentation and mechanical mapping - Kelvin probe force microscopy (KPFM) - Conductive AFM measurements Usage Guidelines AFM Analysis Workflow 1. Topography Analysis - Apply plane leveling corrections - Remove artifacts and no…