FIB Mill Controller Purpose The FIB Mill Controller skill provides focused ion beam process control for site-specific nanofabrication and sample preparation, enabling precise material removal and deposition at the nanoscale. Capabilities - TEM lamella preparation - Nanoscale milling and deposition - Pattern writing and editing - Cross-section imaging - Gas-assisted etching/deposition - Damage minimization protocols Usage Guidelines FIB Processing 1. TEM Lamella Preparation - Deposit protective cap - Rough mill with high current - Fine polish to target thickness 2. Nanofabrication - Define pat…