ToF-SIMS Analyzer Purpose The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity. Capabilities - Molecular ion identification - Surface contamination analysis - 2D and 3D chemical imaging - Isotope labeling detection - Depth profiling - Principal component analysis of spectra Usage Guidelines ToF-SIMS Analysis 1. Spectral Analysis - Identify characteristic fragments - Build peak lists for materials - Apply multivariate analysis 2. Imaging Mode…